Course summary

    1. Secondary and Primary Alignment Procedure

    2. NEG Alignment Procedure for Insulators Analysis

    1. SIMS Sensitivity & Useful Yield

    2. SIMS Quantification & Standards

    3. Isotopic / Elemental Quantification in WinCurve

    4. Chain Plus Software

    5. High Mass Resolution

    6. High Resolution Analysis

    7. Optimization of Depth Profiling Analysis

    8. Pre-Sputtering Method for Light Elements Analysis

    9. Small Area Analysis with Checkerboard

    10. Small Area Analysis with MESA

    11. Ultra-Thin DPN Oxynitride Analysis

    12. B, C, O Analysis in SiGe at 250eV

    13. SmartPRO Software

    14. SiGe:B Quantification Protocol

    15. Raster Change Method - Light Elements Bulk Concentration

    16. Coming soon: Ultra low impact energy analysis with Ox source : B shallow implant

    17. Coming soon: Ultra low impact energy analysis with Cs source : P shallow implant

    18. Coming soon: High impact energy analysis: LED structures

About this course

  • 20 lessons
  • 1 hour of video content